Analizador de tamaño de partículas LS 13 320 XR

Para grandes mejoras que le ayudan a detectar pequeñas diferencias.

El LS 13 320 XR ofrece los mejores datos de distribución de tamaño de partículas de su clase mediante tecnología PIDS avanzada*, la cual permite mediciones de alta resolución y un intervalo dinámico ampliado. Al igual que sucede con el LS 13 320, el analizador de tamaño de partículas XR proporciona resultados rápidos y precisos y le ayuda a agilizar los flujos de trabajo para optimizar la eficiencia. Algunas grandes mejoras le ayudan a detectar de manera fiable pequeñas diferencias que pueden tener un gran impacto en sus datos de análisis de partículas.

Documentación y notas de aplicación

Elija un modelo LS 13 320 XR

LS 13 320 XR Features

Spot Small Differences

  • Expanded measurement range: 10 nm – 3,500 µm
  • Laser diffraction plus advanced Polarization Intensity Differential Scattering (PIDS) technology enable high-resolution measurement & reporting of real data down to 10 nm
  • Provides accurate, reliable detection of multiple particle sizes in a single sample

Easy-To-Use Software

  • ADAPT Software features automatic pass/fail check
  • Pre-configured methods deliver results with 3 clicks or less
  • Simplifies analyzer operation by experts & novice users alike
  • 1-click overlay with historical data
  • Intuitive user diagnostics keep you informed during sampling
  • Simplified method creation for standardized measurements

ADAPT Software enables 21 CFR Part 11

  • Customizable security system to meet diverse needs
  • Choose from 4 security levels
  • High-security configuration supports 21 CFR Part 11

PIDS Technology* for Direct Detection of 10 nm Particles

  • 3 light wavelengths (450, 600, & 900 nm) irradiate samples with vertical & horizontal polarized light
  • Analyzer measures scattered light from samples over a range of angles
  • Differences between horizontally & vertically radiated light for each wavelength yield high-resolution particle size distribution data

LS 13 320 XR Product Specifications

Light Source Diffraction: Solid-state (780 nm) PIDS: Tungsten lamp with high-quality band-pass filters (450, 600 and 900 nm)
Particle Size Analysis Range 10 nm | 3,500 µm|
Fluid Compatibility Emulsions, Suspensions, Powders
Reporting PDF, Excel
Item Specifications Referenced B98100

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